[1] Balakrishnan N, Ling M H. Expectation maximization algorithm for one shot device accelerated life testing with weibull lifetimes, and variable parameters over stress[J]. IEEE Transactions on Reliability, 2013, 62(2):537-551. [2] Shi Y, Meeker W Q. Bayesian methods for accelerated destructive degradation test planning[J]. IEEE Transactions on Reliability, 2012, 61(1): 245-253. [3] 邓爱民, 陈循, 张春华, 等. 加速退化试验技术综述[J]. 兵工学报, 2007, 28(8): 1002-1007. DENG Ai-min, CHEN Xun, ZHANG Chun-hua, et al. A comprehensive review of accelerated degradation testing[J]. Acta Armamentarii, 2007,28(8):1002-1007.(in Chinese) [4] Wang F, Chu T. Lifetime predictions of LED-based light bars by accelerated degradation test[J]. Microelectronics Reliability, 2012, 52(7):1332-1336. [5] 赵建印, 刘芳, 奚文骏. 退化失效与突发失效共存下产品可靠性模型与评估方法研究[J]. 兵工学报, 2011, 32(9): 1136-1139. ZHAO Jian-yin, LIU Fang, XI Wen-jun. Reliability model and evaluation method of products in competing failure modes[J]. Acta Armamentarii, 2011, 32(9): 1136-1139.(in Chinese) [6] 马小兵, 王晋忠, 赵宇. 基于伪寿命分布的退化数据可靠性评估方法[J]. 系统工程与电子技术, 2011,33(1):228-232. MA Xiao-bing, WANG Jin-zhong, ZHAO Yu. Reliability assessment using constant-stress accelerated degradation data based on pseudo life distribution[J]. System Engineering and Electronics, 2011, 33(1):228-232.(in Chinese) [7] 王浩伟, 徐廷学, 周伟. 综合退化数据与寿命数据的某型电连接器寿命预测方法[J]. 上海交通大学学报, 2014,48(5):702-706. WANG Hao-wei, XU Ting-xue, ZHOU Wei. Lifetime prediction method for missile electrical connector synthesizing degradation data and lifetime data[J]. Journal of Shanghai Jiaotong University, 2014,48(5):702-706.(in Chinese) [8] Park J I, Bae S J. Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests[J]. IEEE Transactions on Reliability, 2010, 559(1):74-90. [9] Pieruschka E. Relation between lifetime distribution and the stress level causing failure, LMSD-400800[R]. Sunnyvale, CA:Lockheed Missile and Space Division, 1961. [10] 赵宇. 可靠性数据分析[M]. 北京: 国防工业出版社, 2011: 99-121. ZHAO Yu. Reliability data analysis[M]. Beijing: National Defense Industry Press, 2011: 99-121.(in Chinese) [11] 周源泉, 翁朝曦, 叶喜涛. 论加速系数与失效机理不变的条件(Ⅰ)——寿命型随机变量的情况[J]. 系统工程与电子技术, 1996, 18(1):55-67. ZHOU Yuan-quan, WENG Zhao-xi, YE Xi-tao. Study on accelerated factor and condition for constant failure mechanism[J]. Systems Engineering and Electronics, 1996, 18(1):55-67. (in Chinese) [12] 杨宇航, 周源泉. 加速寿命试验的理论基础(Ⅰ)[J]. 推进技术, 2001, 22(4):276-278. YANG Yu-hang, ZHOU Yuan-quan. Theoretical foundation of accelerated life(Ⅰ)[J]. Journal of Propulsion Technology, 2001, 22(4): 276-278. (in Chinese) [13] 冯静, 周经伦. 基于退化失效数据的环境因子问题研究[J]. 航空动力学报, 2010, 25(7):1622-1627. FENG Jing, ZHOU Jing-lun. Research on environmental factor based on degradation data[J]. Journal of Aerospace Power, 2010, 25(7):1622-1627. (in Chinese) [14] Grace A W, Wood I A. Approximating the tail of the Anderson-Darling distribution[J]. Computational Statistics & Data Analysis, 2012,56(12):4301-4311. [15] Meeker W Q, Escobar A. Statistical methods for reliability data[M]. New York: John Wiley & Sons, 1998: 631-633. |