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兵工学报 ›› 2024, Vol. 45 ›› Issue (12): 4350-4363.doi: 10.12382/bgxb.2023.1091

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基于改进SSD算法的紫外像增强器视场瑕疵检测方法

丁习文1, 程宏昌1,2, 袁渊1,2, 苏悦1,*()   

  1. 1 昆明物理研究所, 云南 昆明 650223
    2 微光夜视技术重点实验室, 陕西 西安 710065

Detection Method for Field-of-view Defect of Ultraviolet Image Intensifier Based on Improved SSD Algorithm

DING Xiwen1, CHENG Hongchang1,2, YUAN Yuan1,2, SU Yue1,*()   

  1. 1 Kunming Physics Research Institute, Kunming 650223, Yunnan, China
    2 Key Laboratory of Low-Light-Level Night Vision Technology, Xi’an 710065, Shaanxi, China
  • Received:2023-11-07 Online:2024-03-22

摘要:

紫外像增强器视场瑕疵是影响器件成像效果的重要因素之一。针对视场瑕疵样本数量少和视场图像显示差异大的问题,采取相应的数据增强策略,并在单发多框检测(Single Shot multibox Detector,SSD)算法的基础上,添加特征金字塔网络(Feature Pyramid Network,FPN),以解决多尺度特征难以有效识别与融合的问题。同时引入卷积注意力模块(Convolutional Block Attention Module,CBAM)去进一步加强网络对小瑕疵目标信息的关注,并抑制噪声干扰。试验结果表明:在自建的数据集上,添加了FPN和CBAM的SSD(Feature Pyramid Network-Convolutional Block Attention Module-Single Shot Multibox Detector,FPN-CBAM-SSD)算法在视场瑕疵实际检测效果方面更优于SSD算法。对于亮点、暗斑、条纹状、亮斑和暗点这5类瑕疵,其平均精准度分别提高了19.76%、22.84%、29.56%、34.55%和38.14%。FPN-CBAM-SSD算法能够满足实际应用需求,适应更加复杂的视场情况,可视为一种有效的紫外像增强器视场瑕疵检测新型方法。

关键词: 紫外像增强器, 视场瑕疵检测, 机器视觉, 深度学习

Abstract:

The field-of-view defect of UV image intensifier is acknowledged as a crucial element impacting the imaging performance of such device. The data enhancement procedures are used to address the issues of few field-of-view defect samples and the significant variances of images in field-of-view. A feature pyramid network (FPN) is added to the single shot multibox detector (SSD) algorithm for the successful detection and fusion of multiscale features. A convolutional block attention module (CBAM) is also introduced to improve the network’s focus on small defect targets and minimize noise interference. The experimental results show that, on the self-constructed dataset, the feature pyramid network-convolutional block attention module-single shot multibox detector (FPN-CBAM-SSD) algorithm outperforms the SSD algorithm significantly in the actual detection of field-of-view defects. For 5 categories of defects including bright spots, dark patches, striped defects, bright patches, and dark spots, the average detection accuracy is improved by 19.76%, 22.84%, 29.56%, 34.55%, and 38.14%, respectively. FPN-CBAM-SSD algorithm is capable of meeting the practical application requirements and adapting to more complex field-of-view conditions, making it an effective method for detecting field-of-view defects in ultraviolet image intensifiers.

Key words: ultraviolet image intensifier, field-of-view defect detection, machine vision, deep learning

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