Abstract: Low-level-light (LLL) weapon sight measurement technologies are always concerned by military equipment manufacturers. The load actions of vibration, shooting, shock, drop, high and low temperature environment, etc. make the machinery, the optical structure and the electric performance parameters of the sight to change with the result that the sight can’t be worked and used normally at taking aim. In order to solve the problems above, the measure and test system of the sight was de?signed under environmental experiment condition, the operation principle of the detection system by CCD was given, the image of the sight was processed by the histogram equalization algorithm. The measure precision which is less than 0.05 mil and the measure range which is greater than 40 mil can meet the requirements of the engineering application.

Key words: electron technology , histogram equalization , low-level-light weapon sight , measurement