[1] LALL P,HANDE M, BHAT C, et al. Prognostics and health management of electronics[C]∥Proceedings of International Symposium on Advanced Packaging Materials:Processes, Properties and Interface. Atlanta,GA,US: IEEE, 2006. [2] DORJ E, CHEN C, PECHT M. A Bayesian hidden Markov model-based approach for anomaly detection in electronic systems[C]∥ Proceedings of Aerospace Conference. Big Sky,UK: IEEE, 2013. [3] KUNCHE S, CHEN C, PECHT M. Optimized diagnostic model combination for improving diagnostic accuracy[C]∥ Proceedings of Aerospace Conference. Big Sky,UK: IEEE, 2013. [4] SAHA B, CELAYA J R, WYSOCKI P F, et al. Towards prognostics for electronics components[C]∥Proceedings of Aerospace Conference.Big Sky,UK: IEEE, 2009. [5] 于格,康锐,林焱辉,等. 基于确信可靠度的齿轮可靠性建模与分析[J]. 系统工程与电子技术,2019,41(10):2385-2391. YU G, KANG R, LIN Y H, et al. Modeling and analysis of gear reliability based on certainty reliability [J]. Systems Engineering and Electronics, 2019, 41(10):2385-2391.(in Chinese) [6] 查国清,黄小凯,康锐. 基于多应力加速试验方法的智能电表寿命评估[J]. 北京航空航天大学学报,2015,41(12):2217-2224. ZHA G Q, HUANG X K, KANG R. Life evaluation of smart meter based on multi stress accelerated test method [J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(12): 2217-2224. (in Chinese) [7] 查国清,井海龙,陈云霞,等. 基于故障行为模型的产品寿命分析方法[J]. 北京航空航天大学学报,2016,42(11):2371-2377. ZHA G Q, JING H L, CHEN Y X,et al. Product life analysis method based on fault behavior model[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(11):2371-2377. (in Chinese) [8] 蒋旭,曾志国,康锐,等. 基于朴素贝叶斯分类的电子产品可靠性仿真试验效果评价方[J]. 电子科学技术, 2015,2(1):49-54. JIANG X, ZENG Z G, KANG R, et al. Effect evaluation method of electronic product reliability simulation test based on naive Bayes classification [J]. Electronic Science and Technology, 2015, 2(1):49-54. (in Chinese) [9] LONG B, TIAN S, MIAO Q, et al. Research on features for diagnostics of filtered analog circuits based on LS-SVM[C]∥Procee- dings of Autotestcom. Baltimore, MD, US: IEEE, 2011: 360-366. [10] 刘震,王厚军,龙兵,等.一种基于加权隐马尔可夫的自回归状态预测模型[J].电子学报,2009,37(10):2113-2118. LIU Z, WANG H J, LONG B, et al. An autoregressive state prediction model based on weighted hidden Markov [J]. Acta Electronica Sinica, 2009,37(10):2113-2118.(in Chinese) [11] 许丽佳,王厚军,龙兵.基于贝叶斯网络的复杂系统故障预测[J].系统工程与电子技术,2008,30(4):780-784. XU L J, WANG H J, LONG B. Fault prediction of complex system based on Bayesian Network[J].Systems Engineering and Electronics, 2008,30(4):780-784.(in Chinese) [12] 许丽佳,龙兵,王厚军.基于LSSVM-HMM的发射机故障预测研究[J].仪器仪表学报,2008,29(1):21-26. XU L J, LONG B, WANG H J. Research on transmitter fault prediction based on LSSVM-HMM[J].Chinese Journal of Scientific Instrument, 2008,29(1):21-26.(in Chinese) [13] 周靖宇,田书林,王厚军,等.采用电压特征的模拟电路单元件预测方法研究[J].微电子学与计算机,2015,32(12):44-48,53. ZHOU J Y, TIAN S L, WANG H J, et al. Research on prediction method of analog circuit unit based on voltage characteristics[J].Microelectronics & Computer,2015, 32(12):44-48,53. (in Chinese) [14] 吕克洪,程先哲,李华康,等. 电子设备故障预测与健康管理技术发展新动态[J]. 航空学报,2019,40(11):18-29. L K H, CHENG X Z, LI H K, et al. New development trend of electronic equipment fault prediction and health management technology[J]. Acta Aeronautica et Astronautica Sinica, 2019, 40(11):18-29. (in Chinese) [15] 吕克洪,邱静,刘冠军.基于动态损伤及优化AR模型的电子器件寿命预测方法研究[J].兵工学报,2009,30(1):91-95. L K H, QIU J, LIU G J. Research on the life prediction method of electronic devices based on dynamic damage and optimized AR model[J].Acta Armamentarii,2009, 30(1):91-95. (in Chinese) [16] 吕克洪,邱静,刘冠军. 机电系统损伤与时间应力关系的动态描述模型[J].仪器仪表学报,2008,29(8):1788-1792. L K H, QIU J, LIU G J. Dynamic description model of the relationship between mechanical and electrical system damage and time stress[J].Chinese Journal of Scientific Instrument, 2008, 29(8):1788-1792. (in Chinese) [17] 吕克洪,邱静,刘冠军.基于多组件动态损伤的系统故障预测方法研究[J].系统工程与电子技术,2008,30(10):2014-2018. L K H, QIU J, LIU G J. Research on system fault prediction method based on multi-component dynamic damage[J].Systems Engineering and Electronics, 2008,30(10):2014-2018. (in Chinese) [18] 席霄鹏,陈茂银,周东华.基于多速率传感器测量数据的剩余寿命预测[J].控制工程,2020,27(5):771-775. XI X P, CHEN M Y, ZHOU D H. Remaining useful life prediction based on multirate sensor measurement data[J]. Control Engineering of China,2020,27(5):771-775.(in Chinese) [19] 张朝龙,何怡刚,杜博伦, 等.基于深度学习的电力变压器智能故障诊断方法[J].电子测量与仪器学报,2020,34(1):81-89. ZHANG C L, HE Y G, DU B L, et al. Intelligent fault diagnosis method of power transformer using deep learning [J]. Journal of Electronic Measurement and Instrumentation, 2020, 34(1):81-89. (in Chinese) [20] 樊浩,李兴文,苏海博, 等.基于主成分分析—支持向量机优化模型的断路器故障诊断方法研究[J].高压电器,2020,56(6): 143-151. FAN H, LI X W, SU H B, et al. Research on circuit breaker fault diagnosis method based on principal component analysis support vector machine optimization model[J]. High Voltage Apparatus, 2020, 56(6):143-151. (in Chinese) [21] VICHARE N,PECHT M.Prognostics and health management of electronics[C]∥Proceedings of the 11st International Symposium on Advanced Packaging Materials: Processes, Properties and Interface. Atlanta,GA, US:IEEE, 2006:222-229. [22] HOCHREITER S,SCHMIDHUBER J.Long short-term memory[J]. Neural Computation, 1997, 9(8):1735-1780. [23] 邱锡鹏.神经网络与深度学习[M].北京:机械工业出版社,2020. QIU X P. Neural networks and deep learning [M]. Beijing: China Machine Press, 2020. (in Chinese) [24] 集明,熊刚,张海燕.幅相二元距离加权的自适应滑动平均滤波[J].计算机工程与应用,2012,48(10):141-145. JI M, XIONG G, ZHANG H Y. Amplitude phase binary distance weighted adaptive moving average filtering[J]. Computer Engineering and Applications,2012, 48(10):141-145. (in Chinese) [25] GOODFELLOW I, BENGIO Y, COURVILLE A. Deep learning [M]. Cambridge, MA, US:MIT Press,2016. [26] TESTA A, CARO S D, PANARELLO S, et al. Stress analysis and lifetime estimation on power MOSFETs for automotive ABS systems[C]∥Proceedings of Power Electronics Specialists Conference. Rhodes, Greece:IEEE, 2008:1169-1175.
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