Research on Thermal Fatigue Failure Mechanism of Aviation Electrical Connectors

doi:10.3969/j.issn.1000-1093.2016.07.015

Abstract

Abstract: Jack of electrical connectors is an elastic element. It is easy to show thermal fatigue and stress relaxation phenomenon under the effect of alternating thermal stress, which affects the contact reliability of electrical connectors. A thermal fatigue test scheme is proposed, and a test circuit is designed for experiment. The thermal fatigue failure mechanism of electrical connectors is analyzed. The test result shows that the value of contact resistance increases slowly with the increase in the number of thermal cycles. The macroscopic reason is that the aperture of jack increases and the contact pressure between contacts decreases. During test, the temperature difference or temperature change rate will accelerate the growth of contact resistance. Based on the metallographic analysis of jack after experiment, it is found that the change of microstructure (the crystal size and slip line density increase, the difference of slip direction is enhanced) is the fundamental reason to lead to the stress relaxation phenomenon of jacks and the contact reliability degradation of electrical connectors. The comprehensive effect of the temperature difference and temperature change rate on the performance degradation of electrical connectors depends on the “confrontation” between slip line density and slip direction number.

Key words: aerocraft instrument and equipment, aviation electrical connector, thermal fatigue, stress relaxation, metallographic analysis, failure mechanism, performance degradation

CLC Number:

LUO Yan-yan, LIU Xu-yang, HAO Jie, WANG Zhen, LIU Lei, LIN Xiao-ming. Research on Thermal Fatigue Failure Mechanism of Aviation Electrical Connectors[J]. Acta Armamentarii, 2016, 37(7): 1266-1274.

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