Abstract: A novel test selection method is proposed based on greedy algorithm, which is used for fault detection and isolation, to overcome the shortcomings of the traditional test optimization algorithms, such as poor universality. The method is used to select the required test with aim of the minimal number of tests. Then the optimal test is selected gradually by greedy search. Finally, the validity of the proposed method is verified by using the binary-value and multi-value test optimization cases. Theoretical and case studies show that the proposed method is not only effective to excavate the fault detection and isolation ability of tests with low time complexity, but also applicable to the binary-value and multi-value test optimization of isolating the fauts to replaceable unit and specific failure mode.

Key words: ordnance science and technology, test optimization, greedy algorithm, fault detection, fault isolation