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Acta Armamentarii ›› 2014, Vol. 35 ›› Issue (12): 2098-2103.doi: 10.3969/j.issn.1000-1093.2014.12.024

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A Reliability Modeling Approach to Avoiding Mis-specification of Pseudo Life Distribution in CSADT

XU Ting-xue1, WANG Hao-wei1, ZHANG Lei2   

  1. (1.Department of Ordnance Science and Technology, Naval Aeronautical and Astronautical University,2.Department of Scientific Research, Naval Aeronautical and Astronautical University, Yantai 264000, Shandong, China)
  • Received:2014-03-13 Revised:2014-03-13 Online:2015-02-06
  • Contact: XU Ting-xue E-mail:xtxyt@163.com

Abstract: A reliability modeling approach based on parameter conversion is proposed to avoid the mis-specification of pseudo-life distribution in constant stress accelerated degradation test (CSADT). The proposed method models the parameters of degradation path functions. It is different from the traditional method that models the parameters of distribution functions. The pseudo life of all samples under the working stress is evaluated, and the distribution type can be accurately identified. A application example with the CSADT data of carbon-film resistors is provided. The research results show that the proposed method can effectively resolve the problem of mis-specification of pseudo-life distribution.

Key words: ordnance science and technology, constant stress accelerated degradation test, pseudo life, mis-specification, acceleration factor

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