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Reliability Assessment for Device with Only Safe-or-failure Pattern Based on Bayesian Hyprid Prior Approach
ZHANG Wen-jie, YANG Hua-bo, ZHANG Shi-feng
Acta Armamentarii . 2016, (3): 505 -511 .  DOI: 10.3969/j.issn.1000-1093.2016.03.016