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Acta Armamentarii ›› 2015, Vol. 36 ›› Issue (4): 577-581.doi: 10.3969/j.issn.1000-1093.2015.04.001

• Paper •     Next Articles

Test and Analysis of Silicon Stack Failure in Electrothermal-chemical Launch

LI Zhen-xiao, ZHANG Ya-zhou, GAO Liang, JIN Yong, LI Bao-ming   

  1. (National Key Laboratory of Transient Physics, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu, China)
  • Received:2014-04-01 Revised:2014-04-01 Online:2015-06-02
  • Contact: LI Zhen-xiao E-mail:lizhxnjust@126.com

Abstract: The silicon stack damage is observed in electrothermal-chemical launch experiment. The details of the possible reasons are analyzed. And the reasons are determined through mechanical vibration impact test, simulation and tests of pulse power supply discharge, and reverse recovery characteristics measurements of silicon stack. Results show that the mechanical vibration shock cannot lead to the silicon stack damage in electrothermal-chemical launch. The silicon stack damage is mainly caused by the cooperation of the reverse recovery characteristics of series components, the inductance characteristic of load and the asynchronous discharge of pulse power supply. The large inductance of the transmission lines is the direct cause for the damage of the silicon stacks in the system.

Key words: ordnance science and technology, pulse power supply, high-voltage silicon stack, electrothermal chemical launch, overvoltage

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