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Acta Armamentarii ›› 2014, Vol. 35 ›› Issue (9): 1408-1413.doi: 10.3969/j.issn.1000-1093.2014.09.012

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Damage Effect of Charged Coupled Device with Multiple-pulse Picosecond Laser

SHAO Jun-feng1,2, LIU Yang3, WANG Ting-feng1, GUO Jin1   

  1. (1.State Key Laboratory of Laser Interaction with Matter, Changchun Institute of Optics, Fine Mechnics and Physics,Chinese Academy of Sciences, Changchun 130033, Jilin, China;2.University of Chinese Academy of Science,3.Institute of North Electronic Equipment, Beijing 100191, China)
  • Received:2013-12-17 Revised:2013-12-17 Online:2014-11-03
  • Contact: SHAO Jun-feng E-mail:shaojunfeng1984@163.com

Abstract: The action mechanism of high repetitive ultra-short laser interaction on electro-optic system has been drawn great attention recently. The experimental damage effect and mechanism of single and multiple-pulse picosecond lasers on Wat-902B interline charged coupled device (CCD) are reserched. The experimental setup mainly includes lasers, test subject, and camera. It maintains that the picosecond laser points at the optical entrance puil of camera all the time. The camera is installed on an electric revolving stage to control the time of intersection between a laser and the test subject. The second moment method is employed to obtain the laser diameters on CCD surface and its accuracy is better than 20.3%. The experimental results show that the functional damage threshold of multiple-pulse laser is about 13.6~121.0 mJ/cm2, which is severely lower than that of 1.5 ns and 400 ps kilohertz-repetition-rate single-pulse lasers, approximating 263~1 146 mJ/cm2. The damage mechanism of single-pulse laser is to lead to short circuit between CCD vertical transfer electrode lines, but the damage mechanism of multiple-pulse laser is obviously different from that of single pulse laser, which is to cause an accumulated damage effect.

Key words: optics, picosecond laser, multiple-pulse laser damage, damage mechanism, charged coupled device

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