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兵工学报 ›› 2020, Vol. 41 ›› Issue (5): 881-889.doi: 10.3969/j.issn.1000-1093.2020.05.007

• 论文 • 上一篇    下一篇

调频连续波引信高功率微波前门耦合效应研究

陈凯柏1, 高敏1, 周晓东2, 惠江海1   

  1. (1.陆军工程大学石家庄校区 导弹工程系, 河北 石家庄 050003; 2.陆军工程大学石家庄校区 弹药工程系, 河北 石家庄 050003)
  • 收稿日期:2019-07-12 修回日期:2019-07-12 上线日期:2020-07-17
  • 通讯作者: 周晓东(1976—), 男,副教授 E-mail:zxd_oec@sina.com
  • 作者简介:陈凯柏(1996—), 男,博士研究生。E-mail:billlasaier@sina.com
  • 基金资助:
    装备科研项目(LJ20182A050323)

Research on Coupling Effect of High-power Microwave Front-gate in FMCW Fuze

CHEN Kaibai1, GAO Min1, ZHOU Xiaodong2, HUI Jianghai1   

  1. (1.Department of Missile Engineering, Shijiazhuang Campus, Army Engineering University, Shijiazhuang 050003, Hebei, China; 2.Department of Ammunition Engineering, Shijiazhuang Campus, Army Engineering University, Shijiazhuang 050003, Hebei, China)
  • Received:2019-07-12 Revised:2019-07-12 Online:2020-07-17

摘要: 针对调频连续波引信在高功率微波辐照下的前门耦合问题,对引信射频前端进行场路联合仿真实验。利用仿真软件建立引信射频前端模型,采用先辐照、后注入的实验方法对引信前门耦合效应进行分析。实验结果表明:引信射频前端敏感元器件容易被耦合进入的高功率微波毁伤,当脉冲信号上升时间较短时,毁伤效果更为明显;当高功率微波源与引信距离较远时,引信的正常测距功能会受到干扰,但脉冲信号的平顶宽度变化所造成的干扰效应并不明显。

关键词: 调频连续波引信, 高功率微波, 前门耦合效应, 联合仿真

Abstract: The field-circuit joint simulation test of the fuze RF front-end was made for the front-gate coupling of fuze under high-power microwave irradiation. A RF front-end model of fuze is established by simulation software, and the coupling effect of front-gate of fuze is analyzed by the test method of irradiation before injection. The test results show that the sensing elements of RF front-end of fuze are easy to be damaged by high-power microwave. The damage effect of high-power microwave is more obvious when the rise time of pulse signal is short; and when the distance between HPM source and fuze is long, the normal ranging function of fuze will be disturbed, but the interference effect caused by the change of flat top width of pulse signal is not obvious. Key

Key words: FMCWfuze, high-powermicrowave, front-gatecouplingeffect, jointsimulation

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